Changes in the near-surface stress in titanium caused by krypton ion-implantation

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dc.contributor.authorTunde, Raji Abdulrafiuen_ZA
dc.date.accessioned2014-08-13T20:03:28Z
dc.date.available2014-08-13T20:03:28Z
dc.date.issued2006en_ZA
dc.descriptionWord processed copy.en_ZA
dc.descriptionIncludes bibliographical references.en_ZA
dc.description.abstractIn this work, the effect of krypton implantation on the morphology of titanium samples is investigated through scanning electron microscopy (SEM). Rutherford backscattering spectrometry (RBS) was also used to determine the dose and depth of implanted krypton. The krypton profiile in titanium, and the associated damage profile, was modelled with TRIM calculations. In addition, metallurgical techniques were also used to examine the microstructure details of the as-received, unimplanted titanium sample.en_ZA
dc.identifier.apacitationTunde, R. A. (2006). <i>Changes in the near-surface stress in titanium caused by krypton ion-implantation</i>. (Thesis). University of Cape Town ,Faculty of Science ,Department of Physics. Retrieved from http://hdl.handle.net/11427/6515en_ZA
dc.identifier.chicagocitationTunde, Raji Abdulrafiu. <i>"Changes in the near-surface stress in titanium caused by krypton ion-implantation."</i> Thesis., University of Cape Town ,Faculty of Science ,Department of Physics, 2006. http://hdl.handle.net/11427/6515en_ZA
dc.identifier.citationTunde, R. 2006. Changes in the near-surface stress in titanium caused by krypton ion-implantation. University of Cape Town.en_ZA
dc.identifier.ris TY - Thesis / Dissertation AU - Tunde, Raji Abdulrafiu AB - In this work, the effect of krypton implantation on the morphology of titanium samples is investigated through scanning electron microscopy (SEM). Rutherford backscattering spectrometry (RBS) was also used to determine the dose and depth of implanted krypton. The krypton profiile in titanium, and the associated damage profile, was modelled with TRIM calculations. In addition, metallurgical techniques were also used to examine the microstructure details of the as-received, unimplanted titanium sample. DA - 2006 DB - OpenUCT DP - University of Cape Town LK - https://open.uct.ac.za PB - University of Cape Town PY - 2006 T1 - Changes in the near-surface stress in titanium caused by krypton ion-implantation TI - Changes in the near-surface stress in titanium caused by krypton ion-implantation UR - http://hdl.handle.net/11427/6515 ER - en_ZA
dc.identifier.urihttp://hdl.handle.net/11427/6515
dc.identifier.vancouvercitationTunde RA. Changes in the near-surface stress in titanium caused by krypton ion-implantation. [Thesis]. University of Cape Town ,Faculty of Science ,Department of Physics, 2006 [cited yyyy month dd]. Available from: http://hdl.handle.net/11427/6515en_ZA
dc.language.isoengen_ZA
dc.publisher.departmentDepartment of Physicsen_ZA
dc.publisher.facultyFaculty of Scienceen_ZA
dc.publisher.institutionUniversity of Cape Town
dc.subject.otherPhysicsen_ZA
dc.titleChanges in the near-surface stress in titanium caused by krypton ion-implantationen_ZA
dc.typeMaster Thesis
dc.type.qualificationlevelMasters
dc.type.qualificationnameMScen_ZA
uct.type.filetypeText
uct.type.filetypeImage
uct.type.publicationResearchen_ZA
uct.type.resourceThesisen_ZA
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