The topology and electrical properties of nanoparticle networks

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dc.contributor.advisorBritton, David Ten_ZA
dc.contributor.advisorHärting, Margiten_ZA
dc.contributor.authorJonah, Emmanuel Ohiekuen_ZA
dc.date.accessioned2014-10-27T19:36:08Z
dc.date.available2014-10-27T19:36:08Z
dc.date.issued2014en_ZA
dc.descriptionIncludes bibliographical references.en_ZA
dc.description.abstractThe bulk and surface network topologies of milled silicon nanoparticle aggregates in layers deposited on porous and non-porous substrates have been quantitatively characterised using laboratory and synchrotron based small angle X-ray scattering and ultra-small angle X-ray scattering, as well as with a new surface scattering technique developed for this research, which can be described as wide angle low q scattering. A new scaling model applied to the small angle and ultra-small angle X-ray scattering data which was originally developed to describe branched polymers was shown to be applicable to the description of the networks of silicon particles. The milled particles which have a highly polydisperse size distribution, form agglomerates, which in turn cluster to form larger structures with a very high degree of aggregation. Results from the new scattering technique showed the rough surface of the printed layers to have a fractal structure with step heights of 10% to 20% between adjacent particles. This value is consistent with the topology of the particle aggregates in the layer inferred from ultra-small angle X-ray scattering. Flow properties of the inks on different substrates lead to quantitative differences in the mean aggregate separation, with slowly curing systems on materials which allow good capillary flow resulting in denser networks with smaller aggregates and better contact between particles. The electrical conductance of the layers was shown to be linearly related to parallel connections of the minimum paths of particles through the aggregates as determined from the analysis of ultra-small angle X-ray scattering data. The capacitance of the layers was shown to have a linear dependence on both the separation between primary particles and series connection of the minimum paths.en_ZA
dc.identifier.apacitationJonah, E. O. (2014). <i>The topology and electrical properties of nanoparticle networks</i>. (Thesis). University of Cape Town ,Faculty of Science ,Department of Physics. Retrieved from http://hdl.handle.net/11427/8806en_ZA
dc.identifier.chicagocitationJonah, Emmanuel Ohieku. <i>"The topology and electrical properties of nanoparticle networks."</i> Thesis., University of Cape Town ,Faculty of Science ,Department of Physics, 2014. http://hdl.handle.net/11427/8806en_ZA
dc.identifier.citationJonah, E. 2014. The topology and electrical properties of nanoparticle networks. University of Cape Town.en_ZA
dc.identifier.ris TY - Thesis / Dissertation AU - Jonah, Emmanuel Ohieku AB - The bulk and surface network topologies of milled silicon nanoparticle aggregates in layers deposited on porous and non-porous substrates have been quantitatively characterised using laboratory and synchrotron based small angle X-ray scattering and ultra-small angle X-ray scattering, as well as with a new surface scattering technique developed for this research, which can be described as wide angle low q scattering. A new scaling model applied to the small angle and ultra-small angle X-ray scattering data which was originally developed to describe branched polymers was shown to be applicable to the description of the networks of silicon particles. The milled particles which have a highly polydisperse size distribution, form agglomerates, which in turn cluster to form larger structures with a very high degree of aggregation. Results from the new scattering technique showed the rough surface of the printed layers to have a fractal structure with step heights of 10% to 20% between adjacent particles. This value is consistent with the topology of the particle aggregates in the layer inferred from ultra-small angle X-ray scattering. Flow properties of the inks on different substrates lead to quantitative differences in the mean aggregate separation, with slowly curing systems on materials which allow good capillary flow resulting in denser networks with smaller aggregates and better contact between particles. The electrical conductance of the layers was shown to be linearly related to parallel connections of the minimum paths of particles through the aggregates as determined from the analysis of ultra-small angle X-ray scattering data. The capacitance of the layers was shown to have a linear dependence on both the separation between primary particles and series connection of the minimum paths. DA - 2014 DB - OpenUCT DP - University of Cape Town LK - https://open.uct.ac.za PB - University of Cape Town PY - 2014 T1 - The topology and electrical properties of nanoparticle networks TI - The topology and electrical properties of nanoparticle networks UR - http://hdl.handle.net/11427/8806 ER - en_ZA
dc.identifier.urihttp://hdl.handle.net/11427/8806
dc.identifier.vancouvercitationJonah EO. The topology and electrical properties of nanoparticle networks. [Thesis]. University of Cape Town ,Faculty of Science ,Department of Physics, 2014 [cited yyyy month dd]. Available from: http://hdl.handle.net/11427/8806en_ZA
dc.language.isoengen_ZA
dc.publisher.departmentDepartment of Physicsen_ZA
dc.publisher.facultyFaculty of Scienceen_ZA
dc.publisher.institutionUniversity of Cape Town
dc.titleThe topology and electrical properties of nanoparticle networksen_ZA
dc.typeDoctoral Thesis
dc.type.qualificationlevelDoctoral
dc.type.qualificationnamePhDen_ZA
uct.type.filetypeText
uct.type.filetypeImage
uct.type.publicationResearchen_ZA
uct.type.resourceThesisen_ZA
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