Tomographic reconstruction of the morphology of silicon nanoparticleclusters

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dc.contributor.advisorHärting, Margiten_ZA
dc.contributor.advisorBritton, David Ten_ZA
dc.contributor.authorJones, Stephen Daviden_ZA
dc.date.accessioned2015-05-27T04:12:16Z
dc.date.available2015-05-27T04:12:16Z
dc.date.issued2014en_ZA
dc.descriptionIncludes bibliographical references.en_ZA
dc.description.abstractSemiconducting silicon nanoparticles and nanoparticle clusters are studied using conventional TEM, high resolution TEM and transmission electron tomography techniques. TEM and TEM based tomography provide the means to determine the size and morphology of primary particles and clusters, while the structure of printed macroscopic layers has previously been characterised via small angle X-ray scattering (SAXS). High resolution TEM studies were also carried out on the nanoparticles at high magnification in order to examine the internal structure of the nanoparticles, which is found to contain both ordered as well as amorphous regions. As the nanoparticle clusters studied in this work are tightly bound, dense structures, traditional alignment techniques do not produce satisfactory alignment of the micrographs from which the tomograms are reconstructed, resulting in reconstructions which possess significant artifacts. This limitation is overcome by the development of a new correlation based alignment technique which produces superior alignment when compared to previous techniques, especially in the case of dense samples. The resulting alignment has allowed for the reconstruction of tomograms from which morphological information of the nanoparticle clusters is inferred. The clusters are found to be tightly bound hierarchical clusters, consisting of a large central core surrounded by smaller particles, whose surfaces are faceted. The morphological information gained from the tomography studies has been combined with the macroscopic structure of the layers to infer the arrangement of the nanoparticle clusters within the particle network of the printed layers.en_ZA
dc.identifier.apacitationJones, S. D. (2014). <i>Tomographic reconstruction of the morphology of silicon nanoparticleclusters</i>. (Thesis). University of Cape Town ,Faculty of Science ,Department of Physics. Retrieved from http://hdl.handle.net/11427/12933en_ZA
dc.identifier.chicagocitationJones, Stephen David. <i>"Tomographic reconstruction of the morphology of silicon nanoparticleclusters."</i> Thesis., University of Cape Town ,Faculty of Science ,Department of Physics, 2014. http://hdl.handle.net/11427/12933en_ZA
dc.identifier.citationJones, S. 2014. Tomographic reconstruction of the morphology of silicon nanoparticleclusters. University of Cape Town.en_ZA
dc.identifier.ris TY - Thesis / Dissertation AU - Jones, Stephen David AB - Semiconducting silicon nanoparticles and nanoparticle clusters are studied using conventional TEM, high resolution TEM and transmission electron tomography techniques. TEM and TEM based tomography provide the means to determine the size and morphology of primary particles and clusters, while the structure of printed macroscopic layers has previously been characterised via small angle X-ray scattering (SAXS). High resolution TEM studies were also carried out on the nanoparticles at high magnification in order to examine the internal structure of the nanoparticles, which is found to contain both ordered as well as amorphous regions. As the nanoparticle clusters studied in this work are tightly bound, dense structures, traditional alignment techniques do not produce satisfactory alignment of the micrographs from which the tomograms are reconstructed, resulting in reconstructions which possess significant artifacts. This limitation is overcome by the development of a new correlation based alignment technique which produces superior alignment when compared to previous techniques, especially in the case of dense samples. The resulting alignment has allowed for the reconstruction of tomograms from which morphological information of the nanoparticle clusters is inferred. The clusters are found to be tightly bound hierarchical clusters, consisting of a large central core surrounded by smaller particles, whose surfaces are faceted. The morphological information gained from the tomography studies has been combined with the macroscopic structure of the layers to infer the arrangement of the nanoparticle clusters within the particle network of the printed layers. DA - 2014 DB - OpenUCT DP - University of Cape Town LK - https://open.uct.ac.za PB - University of Cape Town PY - 2014 T1 - Tomographic reconstruction of the morphology of silicon nanoparticleclusters TI - Tomographic reconstruction of the morphology of silicon nanoparticleclusters UR - http://hdl.handle.net/11427/12933 ER - en_ZA
dc.identifier.urihttp://hdl.handle.net/11427/12933
dc.identifier.vancouvercitationJones SD. Tomographic reconstruction of the morphology of silicon nanoparticleclusters. [Thesis]. University of Cape Town ,Faculty of Science ,Department of Physics, 2014 [cited yyyy month dd]. Available from: http://hdl.handle.net/11427/12933en_ZA
dc.language.isoengen_ZA
dc.publisher.departmentDepartment of Physicsen_ZA
dc.publisher.facultyFaculty of Scienceen_ZA
dc.publisher.institutionUniversity of Cape Town
dc.subject.otherPhysicsen_ZA
dc.titleTomographic reconstruction of the morphology of silicon nanoparticleclustersen_ZA
dc.typeDoctoral Thesis
dc.type.qualificationlevelDoctoral
dc.type.qualificationnamePhDen_ZA
uct.type.filetypeText
uct.type.filetypeImage
uct.type.publicationResearchen_ZA
uct.type.resourceThesisen_ZA
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