The mutual influence of strain fields and point defect distributions in krypton implanted polycrystalline titanium

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dc.contributor.advisorHärting, Margiten_ZA
dc.contributor.advisorBritton, David Ten_ZA
dc.contributor.authorNsengiyumva, Schadracken_ZA
dc.date.accessioned2015-01-08T20:07:17Z
dc.date.available2015-01-08T20:07:17Z
dc.date.issued2008en_ZA
dc.descriptionIncludes abstract.en_ZA
dc.descriptionIncludes bibliographical references (leaves 155-182).en_ZA
dc.description.abstractStress migration of point and open-volume defects in materials is an important problem in a wide variety of applications, such as degradation of metallic interconnects in semiconductor devices, metal fatigue, and radiation damage profiles in ion implantation and surface modification. From a fundamental research view point, this study aims to contribute to a better understanding of the basic processes underlying the effect of stress assisted diffusion of foreign interstitial atoms under stress fields, using the Rutherford backscattering to obtain depth profiles, and synchroton radiation diffraction for the determination of stress fields. This has been achieved by creating a well designed model system of krypton implanted polycrystalline titanium.en_ZA
dc.identifier.apacitationNsengiyumva, S. (2008). <i>The mutual influence of strain fields and point defect distributions in krypton implanted polycrystalline titanium</i>. (Thesis). University of Cape Town ,Faculty of Science ,Department of Physics. Retrieved from http://hdl.handle.net/11427/11812en_ZA
dc.identifier.chicagocitationNsengiyumva, Schadrack. <i>"The mutual influence of strain fields and point defect distributions in krypton implanted polycrystalline titanium."</i> Thesis., University of Cape Town ,Faculty of Science ,Department of Physics, 2008. http://hdl.handle.net/11427/11812en_ZA
dc.identifier.citationNsengiyumva, S. 2008. The mutual influence of strain fields and point defect distributions in krypton implanted polycrystalline titanium. University of Cape Town.en_ZA
dc.identifier.ris TY - Thesis / Dissertation AU - Nsengiyumva, Schadrack AB - Stress migration of point and open-volume defects in materials is an important problem in a wide variety of applications, such as degradation of metallic interconnects in semiconductor devices, metal fatigue, and radiation damage profiles in ion implantation and surface modification. From a fundamental research view point, this study aims to contribute to a better understanding of the basic processes underlying the effect of stress assisted diffusion of foreign interstitial atoms under stress fields, using the Rutherford backscattering to obtain depth profiles, and synchroton radiation diffraction for the determination of stress fields. This has been achieved by creating a well designed model system of krypton implanted polycrystalline titanium. DA - 2008 DB - OpenUCT DP - University of Cape Town LK - https://open.uct.ac.za PB - University of Cape Town PY - 2008 T1 - The mutual influence of strain fields and point defect distributions in krypton implanted polycrystalline titanium TI - The mutual influence of strain fields and point defect distributions in krypton implanted polycrystalline titanium UR - http://hdl.handle.net/11427/11812 ER - en_ZA
dc.identifier.urihttp://hdl.handle.net/11427/11812
dc.identifier.vancouvercitationNsengiyumva S. The mutual influence of strain fields and point defect distributions in krypton implanted polycrystalline titanium. [Thesis]. University of Cape Town ,Faculty of Science ,Department of Physics, 2008 [cited yyyy month dd]. Available from: http://hdl.handle.net/11427/11812en_ZA
dc.language.isoengen_ZA
dc.publisher.departmentDepartment of Physicsen_ZA
dc.publisher.facultyFaculty of Scienceen_ZA
dc.publisher.institutionUniversity of Cape Town
dc.subject.otherPhysicsen_ZA
dc.titleThe mutual influence of strain fields and point defect distributions in krypton implanted polycrystalline titaniumen_ZA
dc.typeDoctoral Thesis
dc.type.qualificationlevelDoctoral
dc.type.qualificationnamePhDen_ZA
uct.type.filetypeText
uct.type.filetypeImage
uct.type.publicationResearchen_ZA
uct.type.resourceThesisen_ZA
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