Thick target pixe analysis

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dc.contributor.advisorPeisach, Maxen_ZA
dc.contributor.advisorThornton, David Aen_ZA
dc.contributor.authorPineda-Vargas, Carlos Aen_ZA
dc.date.accessioned2015-12-28T06:11:11Z
dc.date.available2015-12-28T06:11:11Z
dc.date.issued1993en_ZA
dc.descriptionBibliography: p. 211-221.en_ZA
dc.description.abstractThe evaluation of the physical parameters governing the X-ray yield production in thick targets by charged particles was investigated and matrix correction factors (MCF) were calculated for a wide variety of materials including values for all pure non-gaseous elements or their compounds for the Kα and Lα X-ray lines. These factors were calculated for 1, 2, 3 and 4 MeV proton bombarding energies. A new methodology named 'common matrix type' (CMT) was developed for the determination of trace element concentrations in carbon-rich materials, such as most biological materials, with unknown matrix composition. A universal set of matrix correction factors (MCF) values for these materials was established for trace elements with Z ≥ 19 and irradiations with proton energies in the range of 1 to 4 MeV. A similar methodology was developed for silicon-rich and calcium-rich materials where the main components, Al, Si and Ca do not vary appreciably in their concentrations. CMT methodologies were applied successfully for the determination of trace elemental concentrations in a wide variety of thick target materials, which included archaeological cultural materials, biological tissues and geological ores. The technique of correspondence analysis was used for the statistical analysis of the extended data matrix generated in most of the applications. This technique of interpretation of multielemental data proved to be a valuable tool. Two modes of PIXE application, macro-mode and micro-mode, were evaluated at different ion bombarding energies ranging from 1 to 85 MeV. Experimental X-ray production cross sections at 66 and 85 MeV were evaluated and found to correlate well with theory based on the plane wave Born approximation (PWBA) for the Kα and Kβ lines. It was found that the irradiation of intermediate thickness samples of geological ores by energetic protons (66 MeV) is a suitable technique for the determination of small traces of rare earth metals with detection limits for analysis expected to be below the μg.g-1 range. The fact that energetic protons can be used means that no need for matrix correction is necessary. Micro-PIXE with low energy protons was found suitable for the determination of small traces of metals in human kidney stones and for the study of interrelationships between trace element concentrations with time of stone formation, in stones excreted from a single patient.en_ZA
dc.identifier.apacitationPineda-Vargas, C. A. (1993). <i>Thick target pixe analysis</i>. (Thesis). University of Cape Town ,Faculty of Science ,Department of Chemistry. Retrieved from http://hdl.handle.net/11427/16005en_ZA
dc.identifier.chicagocitationPineda-Vargas, Carlos A. <i>"Thick target pixe analysis."</i> Thesis., University of Cape Town ,Faculty of Science ,Department of Chemistry, 1993. http://hdl.handle.net/11427/16005en_ZA
dc.identifier.citationPineda-Vargas, C. 1993. Thick target pixe analysis. University of Cape Town.en_ZA
dc.identifier.ris TY - Thesis / Dissertation AU - Pineda-Vargas, Carlos A AB - The evaluation of the physical parameters governing the X-ray yield production in thick targets by charged particles was investigated and matrix correction factors (MCF) were calculated for a wide variety of materials including values for all pure non-gaseous elements or their compounds for the Kα and Lα X-ray lines. These factors were calculated for 1, 2, 3 and 4 MeV proton bombarding energies. A new methodology named 'common matrix type' (CMT) was developed for the determination of trace element concentrations in carbon-rich materials, such as most biological materials, with unknown matrix composition. A universal set of matrix correction factors (MCF) values for these materials was established for trace elements with Z ≥ 19 and irradiations with proton energies in the range of 1 to 4 MeV. A similar methodology was developed for silicon-rich and calcium-rich materials where the main components, Al, Si and Ca do not vary appreciably in their concentrations. CMT methodologies were applied successfully for the determination of trace elemental concentrations in a wide variety of thick target materials, which included archaeological cultural materials, biological tissues and geological ores. The technique of correspondence analysis was used for the statistical analysis of the extended data matrix generated in most of the applications. This technique of interpretation of multielemental data proved to be a valuable tool. Two modes of PIXE application, macro-mode and micro-mode, were evaluated at different ion bombarding energies ranging from 1 to 85 MeV. Experimental X-ray production cross sections at 66 and 85 MeV were evaluated and found to correlate well with theory based on the plane wave Born approximation (PWBA) for the Kα and Kβ lines. It was found that the irradiation of intermediate thickness samples of geological ores by energetic protons (66 MeV) is a suitable technique for the determination of small traces of rare earth metals with detection limits for analysis expected to be below the μg.g-1 range. The fact that energetic protons can be used means that no need for matrix correction is necessary. Micro-PIXE with low energy protons was found suitable for the determination of small traces of metals in human kidney stones and for the study of interrelationships between trace element concentrations with time of stone formation, in stones excreted from a single patient. DA - 1993 DB - OpenUCT DP - University of Cape Town LK - https://open.uct.ac.za PB - University of Cape Town PY - 1993 T1 - Thick target pixe analysis TI - Thick target pixe analysis UR - http://hdl.handle.net/11427/16005 ER - en_ZA
dc.identifier.urihttp://hdl.handle.net/11427/16005
dc.identifier.vancouvercitationPineda-Vargas CA. Thick target pixe analysis. [Thesis]. University of Cape Town ,Faculty of Science ,Department of Chemistry, 1993 [cited yyyy month dd]. Available from: http://hdl.handle.net/11427/16005en_ZA
dc.language.isoengen_ZA
dc.publisher.departmentDepartment of Chemistryen_ZA
dc.publisher.facultyFaculty of Scienceen_ZA
dc.publisher.institutionUniversity of Cape Town
dc.subject.otherChemistryen_ZA
dc.titleThick target pixe analysisen_ZA
dc.typeDoctoral Thesis
dc.type.qualificationlevelDoctoral
dc.type.qualificationnamePhDen_ZA
uct.type.filetypeText
uct.type.filetypeImage
uct.type.publicationResearchen_ZA
uct.type.resourceThesisen_ZA
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