Investigating the Optical Link Performance of the End-of Substructure Card and Susceptibility to SEUs
| dc.contributor.advisor | Wyngaard, Jane | |
| dc.contributor.advisor | Keaveney, James | |
| dc.contributor.author | Van, Der Merwe Max | |
| dc.date.accessioned | 2023-07-30T09:13:44Z | |
| dc.date.available | 2023-07-30T09:13:44Z | |
| dc.date.issued | 2023 | |
| dc.date.updated | 2023-07-30T09:12:44Z | |
| dc.description.abstract | Particle physics experiments carried out by CERN attempt to investigate the fundamental forces of matter. One of these experiments is the ATLAS experiment, which studies the proton-proton collisions in the LHC. A series of upgrades are planned to increase the luminosity by a factor of five, leading to the high-luminosity LHC (HL-LHC). This upgrade will increase the potential for new discoveries but brings with it design challenges in relation to the harsh radiation environment and significant data throughput required. The ATLAS experiment is building a new detector to cope with these challenges, titled the Inner Tracker (ITk). A crucial part of this new detector is the End-of-Substructure (EoS) card, which constitutes the interface between the ondetector electronics and the off-detector systems. In addition to the operational challenges, the HL-LHC does not allow for repairs or replacing of EoS cards once operation commences, emphasizing the need for thorough testing and qualification of this component. This thesis focuses on characterizing the performance of the EoS card in the presence of radiation, under non-ideal operating conditions and the impact of optical link parameters. The first set of tests is centered on qualifying the radiation tolerance of the EoS card. The radiation environment within the ITk poses a threat to the stable operation of electronics as energetic particles have the potential to cause erroneous changes in device logic, known as Single Event Upsets (SEU). The SEU susceptibility of the EoS card, with a focus on the Versatile Link Plus Transceiver (VTRx+) component, is studied by irradiating the EoS card with a neutron source with a distributed energy spectrum and a peak energy of 11MeV while performing a bit error rate (BER) test to monitor for radiation induced errors. The second set of tests deals with characterizing the impact of an irregular power supply on the EoS card's performance through simulating noise on the supply lines and monitoring the response in BER. The final set of tests investigates the impact the VTRx+ configuration parameters have on the quality of the optical signal. These tests were carried out at the University of Cape Town (UCT) with the support of DESY, a national research institute in Germany, responsible for the production of the EoS cards. A number of new firmware, software and hardware modules were developed as part of this work in order to carry out the tests required. The most significant of which comprised a novel firmware addition allowing for the evaluation of the optical signal quality with an FPGA. This contribution is now being integrated into the quality control proceedings at DESY, to be used in assessing optical signal quality of the entire set of approximately 1552 EoS cards being produced. | |
| dc.identifier.apacitation | Van, D. M. M. (2023). <i>Investigating the Optical Link Performance of the End-of Substructure Card and Susceptibility to SEUs</i>. (). ,Faculty of Engineering and the Built Environment ,Department of Electrical Engineering. Retrieved from http://hdl.handle.net/11427/38194 | en_ZA |
| dc.identifier.chicagocitation | Van, Der Merwe Max. <i>"Investigating the Optical Link Performance of the End-of Substructure Card and Susceptibility to SEUs."</i> ., ,Faculty of Engineering and the Built Environment ,Department of Electrical Engineering, 2023. http://hdl.handle.net/11427/38194 | en_ZA |
| dc.identifier.citation | Van, D.M.M. 2023. Investigating the Optical Link Performance of the End-of Substructure Card and Susceptibility to SEUs. . ,Faculty of Engineering and the Built Environment ,Department of Electrical Engineering. http://hdl.handle.net/11427/38194 | en_ZA |
| dc.identifier.ris | TY - Master Thesis AU - Van, Der Merwe Max AB - Particle physics experiments carried out by CERN attempt to investigate the fundamental forces of matter. One of these experiments is the ATLAS experiment, which studies the proton-proton collisions in the LHC. A series of upgrades are planned to increase the luminosity by a factor of five, leading to the high-luminosity LHC (HL-LHC). This upgrade will increase the potential for new discoveries but brings with it design challenges in relation to the harsh radiation environment and significant data throughput required. The ATLAS experiment is building a new detector to cope with these challenges, titled the Inner Tracker (ITk). A crucial part of this new detector is the End-of-Substructure (EoS) card, which constitutes the interface between the ondetector electronics and the off-detector systems. In addition to the operational challenges, the HL-LHC does not allow for repairs or replacing of EoS cards once operation commences, emphasizing the need for thorough testing and qualification of this component. This thesis focuses on characterizing the performance of the EoS card in the presence of radiation, under non-ideal operating conditions and the impact of optical link parameters. The first set of tests is centered on qualifying the radiation tolerance of the EoS card. The radiation environment within the ITk poses a threat to the stable operation of electronics as energetic particles have the potential to cause erroneous changes in device logic, known as Single Event Upsets (SEU). The SEU susceptibility of the EoS card, with a focus on the Versatile Link Plus Transceiver (VTRx+) component, is studied by irradiating the EoS card with a neutron source with a distributed energy spectrum and a peak energy of 11MeV while performing a bit error rate (BER) test to monitor for radiation induced errors. The second set of tests deals with characterizing the impact of an irregular power supply on the EoS card's performance through simulating noise on the supply lines and monitoring the response in BER. The final set of tests investigates the impact the VTRx+ configuration parameters have on the quality of the optical signal. These tests were carried out at the University of Cape Town (UCT) with the support of DESY, a national research institute in Germany, responsible for the production of the EoS cards. A number of new firmware, software and hardware modules were developed as part of this work in order to carry out the tests required. The most significant of which comprised a novel firmware addition allowing for the evaluation of the optical signal quality with an FPGA. This contribution is now being integrated into the quality control proceedings at DESY, to be used in assessing optical signal quality of the entire set of approximately 1552 EoS cards being produced. DA - 2023_ DB - OpenUCT DP - University of Cape Town KW - Electrical Engineering LK - https://open.uct.ac.za PY - 2023 T1 - Investigating the Optical Link Performance of the End-of Substructure Card and Susceptibility to SEUs TI - Investigating the Optical Link Performance of the End-of Substructure Card and Susceptibility to SEUs UR - http://hdl.handle.net/11427/38194 ER - | en_ZA |
| dc.identifier.uri | http://hdl.handle.net/11427/38194 | |
| dc.identifier.vancouvercitation | Van DMM. Investigating the Optical Link Performance of the End-of Substructure Card and Susceptibility to SEUs. []. ,Faculty of Engineering and the Built Environment ,Department of Electrical Engineering, 2023 [cited yyyy month dd]. Available from: http://hdl.handle.net/11427/38194 | en_ZA |
| dc.language.rfc3066 | eng | |
| dc.publisher.department | Department of Electrical Engineering | |
| dc.publisher.faculty | Faculty of Engineering and the Built Environment | |
| dc.subject | Electrical Engineering | |
| dc.title | Investigating the Optical Link Performance of the End-of Substructure Card and Susceptibility to SEUs | |
| dc.type | Master Thesis | |
| dc.type.qualificationlevel | Masters | |
| dc.type.qualificationlevel | MSc |