Growth and characterisation of thin film superconductors on oxides, silicon and silicides
dc.contributor.advisor | Pretorius, R | en_ZA |
dc.contributor.advisor | Comrie, Craig M | en_ZA |
dc.contributor.author | Naidoo, R Y | en_ZA |
dc.date.accessioned | 2016-03-04T16:53:53Z | |
dc.date.available | 2016-03-04T16:53:53Z | |
dc.date.issued | 1994 | en_ZA |
dc.description | Includes bibliographical references. | en_ZA |
dc.description.abstract | High Tc thin film superconductors are of great interest because of their potential applications, particularly in the microelectronics field. A successful superconductor microelectronic technology depends both on the ability to grow good quality superconducting thin films, and the need to incorporate these films into multilayer semiconductor devices. In this work the growth and characterisation of high Tc Y₁Ba₂Cu₃O₇ films by inverted cylindrical magnetron sputtering and pulsed ruby laser ablation on oxides, silicon and silicides is investigated. The inverted cylindrical magnetron sputter system has been effectively used to counter the problem of negative ion re-sputtering found in sputter deposition of oxide films. The optimal growth conditions for both these techniques have been determined. Rutherford backscattering spectrometry is used to obtain thickness and stoichiometry information, while X-ray diffraction gave phase and orientational data. Ion channeling was used for structural analysis and Auger electron spectroscopy was used to determine the homogeneity of the films. | en_ZA |
dc.identifier.apacitation | Naidoo, R. Y. (1994). <i>Growth and characterisation of thin film superconductors on oxides, silicon and silicides</i>. (Thesis). University of Cape Town ,Faculty of Science ,Department of Physics. Retrieved from http://hdl.handle.net/11427/17519 | en_ZA |
dc.identifier.chicagocitation | Naidoo, R Y. <i>"Growth and characterisation of thin film superconductors on oxides, silicon and silicides."</i> Thesis., University of Cape Town ,Faculty of Science ,Department of Physics, 1994. http://hdl.handle.net/11427/17519 | en_ZA |
dc.identifier.citation | Naidoo, R. 1994. Growth and characterisation of thin film superconductors on oxides, silicon and silicides. University of Cape Town. | en_ZA |
dc.identifier.ris | TY - Thesis / Dissertation AU - Naidoo, R Y AB - High Tc thin film superconductors are of great interest because of their potential applications, particularly in the microelectronics field. A successful superconductor microelectronic technology depends both on the ability to grow good quality superconducting thin films, and the need to incorporate these films into multilayer semiconductor devices. In this work the growth and characterisation of high Tc Y₁Ba₂Cu₃O₇ films by inverted cylindrical magnetron sputtering and pulsed ruby laser ablation on oxides, silicon and silicides is investigated. The inverted cylindrical magnetron sputter system has been effectively used to counter the problem of negative ion re-sputtering found in sputter deposition of oxide films. The optimal growth conditions for both these techniques have been determined. Rutherford backscattering spectrometry is used to obtain thickness and stoichiometry information, while X-ray diffraction gave phase and orientational data. Ion channeling was used for structural analysis and Auger electron spectroscopy was used to determine the homogeneity of the films. DA - 1994 DB - OpenUCT DP - University of Cape Town LK - https://open.uct.ac.za PB - University of Cape Town PY - 1994 T1 - Growth and characterisation of thin film superconductors on oxides, silicon and silicides TI - Growth and characterisation of thin film superconductors on oxides, silicon and silicides UR - http://hdl.handle.net/11427/17519 ER - | en_ZA |
dc.identifier.uri | http://hdl.handle.net/11427/17519 | |
dc.identifier.vancouvercitation | Naidoo RY. Growth and characterisation of thin film superconductors on oxides, silicon and silicides. [Thesis]. University of Cape Town ,Faculty of Science ,Department of Physics, 1994 [cited yyyy month dd]. Available from: http://hdl.handle.net/11427/17519 | en_ZA |
dc.language.iso | eng | en_ZA |
dc.publisher.department | Department of Physics | en_ZA |
dc.publisher.faculty | Faculty of Science | en_ZA |
dc.publisher.institution | University of Cape Town | |
dc.subject.other | Physics | en_ZA |
dc.title | Growth and characterisation of thin film superconductors on oxides, silicon and silicides | en_ZA |
dc.type | Doctoral Thesis | |
dc.type.qualificationlevel | Doctoral | |
dc.type.qualificationname | PhD | en_ZA |
uct.type.filetype | Text | |
uct.type.filetype | Image | |
uct.type.publication | Research | en_ZA |
uct.type.resource | Thesis | en_ZA |
Files
Original bundle
1 - 1 of 1
Loading...
- Name:
- thesis_sci_1994_naidoo_r_y.pdf
- Size:
- 4.51 MB
- Format:
- Adobe Portable Document Format
- Description: