Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy

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dc.contributor.advisorBritton, David Ten_ZA
dc.contributor.advisorHärting, Margiten_ZA
dc.contributor.authorUnuigbe, David Mowemeen_ZA
dc.date.accessioned2015-01-11T13:32:44Z
dc.date.available2015-01-11T13:32:44Z
dc.date.issued2012en_ZA
dc.descriptionIncludes abstract.en_ZA
dc.descriptionIncludes bibliographical references.en_ZA
dc.description.abstractThe establishment of printing technologies, using nanoparticle based inks, promises inexpensive manufacture of electronic devices. However, to produce working devices, nanoparticles have to meet requirements on size, shape, and composition. In the application of silicon nanoparticles in electronics, it is important that a network of interconnecting particles is formed through which charge transport can take place. Of further importance is that there is an absence of surface oxide in order to maintain a direct silicon-silicon connection within the network. In this work, cheap and scalable production of silicon nanoparticles is achieved efficiently with a top-down process of mechanical attrition by high energy milling.en_ZA
dc.identifier.apacitationUnuigbe, D. M. (2012). <i>Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy</i>. (Thesis). University of Cape Town ,Faculty of Science ,Department of Physics. Retrieved from http://hdl.handle.net/11427/12105en_ZA
dc.identifier.chicagocitationUnuigbe, David Moweme. <i>"Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy."</i> Thesis., University of Cape Town ,Faculty of Science ,Department of Physics, 2012. http://hdl.handle.net/11427/12105en_ZA
dc.identifier.citationUnuigbe, D. 2012. Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy. University of Cape Town.en_ZA
dc.identifier.ris TY - Thesis / Dissertation AU - Unuigbe, David Moweme AB - The establishment of printing technologies, using nanoparticle based inks, promises inexpensive manufacture of electronic devices. However, to produce working devices, nanoparticles have to meet requirements on size, shape, and composition. In the application of silicon nanoparticles in electronics, it is important that a network of interconnecting particles is formed through which charge transport can take place. Of further importance is that there is an absence of surface oxide in order to maintain a direct silicon-silicon connection within the network. In this work, cheap and scalable production of silicon nanoparticles is achieved efficiently with a top-down process of mechanical attrition by high energy milling. DA - 2012 DB - OpenUCT DP - University of Cape Town LK - https://open.uct.ac.za PB - University of Cape Town PY - 2012 T1 - Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy TI - Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy UR - http://hdl.handle.net/11427/12105 ER - en_ZA
dc.identifier.urihttp://hdl.handle.net/11427/12105
dc.identifier.vancouvercitationUnuigbe DM. Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy. [Thesis]. University of Cape Town ,Faculty of Science ,Department of Physics, 2012 [cited yyyy month dd]. Available from: http://hdl.handle.net/11427/12105en_ZA
dc.language.isoengen_ZA
dc.publisher.departmentDepartment of Physicsen_ZA
dc.publisher.facultyFaculty of Scienceen_ZA
dc.publisher.institutionUniversity of Cape Town
dc.subject.otherPhysicsen_ZA
dc.titleCharacterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopyen_ZA
dc.typeMaster Thesis
dc.type.qualificationlevelMasters
dc.type.qualificationnameMScen_ZA
uct.type.filetypeText
uct.type.filetypeImage
uct.type.publicationResearchen_ZA
uct.type.resourceThesisen_ZA
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