Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction
| dc.contributor.advisor | Härting, Margit | |
| dc.contributor.author | Bollhofer, Axel | |
| dc.date.accessioned | 2023-09-07T11:18:44Z | |
| dc.date.available | 2023-09-07T11:18:44Z | |
| dc.date.issued | 1999 | |
| dc.date.updated | 2023-09-07T11:08:13Z | |
| dc.description.abstract | Resistance thermometers are often made of thin, sputter-deposited platinum layers on a corundum substrate. Since such thermometers are usually exposed to extreme temperatures, residual stress is building up at the Pt-Ah03 interface and can possibly damage the layer. Therefore, the stress in the layer is measured by means of non-destructive x-ray diffraction and evaluated by the frequently used "d-sin21/J" method. The apparatus for the measurements was a Q-goniometer with a Bragg-Brentano focusing beam arrangement and a position sensitive detector. X-ray fluorescence scans were also performed on the sample in order to gain information about its composition. Additionally, a scanning-electron-microscope was used to investigate its microstructure. The crystallographic texture of the platinum was also examined by x-ray diffraction and displayed in pole figures. | |
| dc.identifier.apacitation | Bollhofer, A. (1999). <i>Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction</i>. (). ,Faculty of Science ,Department of Physics. Retrieved from http://hdl.handle.net/11427/38444 | en_ZA |
| dc.identifier.chicagocitation | Bollhofer, Axel. <i>"Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction."</i> ., ,Faculty of Science ,Department of Physics, 1999. http://hdl.handle.net/11427/38444 | en_ZA |
| dc.identifier.citation | Bollhofer, A. 1999. Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction. . ,Faculty of Science ,Department of Physics. http://hdl.handle.net/11427/38444 | en_ZA |
| dc.identifier.ris | TY - Master Thesis AU - Bollhofer, Axel AB - Resistance thermometers are often made of thin, sputter-deposited platinum layers on a corundum substrate. Since such thermometers are usually exposed to extreme temperatures, residual stress is building up at the Pt-Ah03 interface and can possibly damage the layer. Therefore, the stress in the layer is measured by means of non-destructive x-ray diffraction and evaluated by the frequently used "d-sin21/J" method. The apparatus for the measurements was a Q-goniometer with a Bragg-Brentano focusing beam arrangement and a position sensitive detector. X-ray fluorescence scans were also performed on the sample in order to gain information about its composition. Additionally, a scanning-electron-microscope was used to investigate its microstructure. The crystallographic texture of the platinum was also examined by x-ray diffraction and displayed in pole figures. DA - 1999_ DB - OpenUCT DP - University of Cape Town KW - Physics LK - https://open.uct.ac.za PY - 1999 T1 - Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction TI - Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction UR - http://hdl.handle.net/11427/38444 ER - | en_ZA |
| dc.identifier.uri | http://hdl.handle.net/11427/38444 | |
| dc.identifier.vancouvercitation | Bollhofer A. Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction. []. ,Faculty of Science ,Department of Physics, 1999 [cited yyyy month dd]. Available from: http://hdl.handle.net/11427/38444 | en_ZA |
| dc.language.rfc3066 | eng | |
| dc.publisher.department | Department of Physics | |
| dc.publisher.faculty | Faculty of Science | |
| dc.subject | Physics | |
| dc.title | Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction | |
| dc.type | Master Thesis | |
| dc.type.qualificationlevel | Masters | |
| dc.type.qualificationlevel | MSc |