Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques

Simple item page
dc.contributor.authorAdegbite, Olusegunen_ZA
dc.date.accessioned2014-08-13T20:03:37Z
dc.date.available2014-08-13T20:03:37Z
dc.date.issued2006en_ZA
dc.descriptionWord processed copy.en_ZA
dc.descriptionIncludes bibliographical references (leaves 83-87).en_ZA
dc.description.abstractIn this work, investigation of light elements incorporated in the amorphous silicon network of hydrogenated and nanocrystalline silicon were analysed by using ion beam analytical techniques. To do this, amorphous silicon films were deposited by hot wire chemical vapour deposition, and a unique sampling method was developed for the analysis of nanocrystalline silicon powder. The combinations of non destructive, quantitative and sensitive Rutherford backscattering, resonance scattering and elastic recoil detection analysis were used in analysing these samples.en_ZA
dc.identifier.apacitationAdegbite, O. (2006). <i>Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques</i>. (Thesis). University of Cape Town ,Faculty of Science ,Department of Physics. Retrieved from http://hdl.handle.net/11427/6522en_ZA
dc.identifier.chicagocitationAdegbite, Olusegun. <i>"Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques."</i> Thesis., University of Cape Town ,Faculty of Science ,Department of Physics, 2006. http://hdl.handle.net/11427/6522en_ZA
dc.identifier.citationAdegbite, O. 2006. Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques. University of Cape Town.en_ZA
dc.identifier.ris TY - Thesis / Dissertation AU - Adegbite, Olusegun AB - In this work, investigation of light elements incorporated in the amorphous silicon network of hydrogenated and nanocrystalline silicon were analysed by using ion beam analytical techniques. To do this, amorphous silicon films were deposited by hot wire chemical vapour deposition, and a unique sampling method was developed for the analysis of nanocrystalline silicon powder. The combinations of non destructive, quantitative and sensitive Rutherford backscattering, resonance scattering and elastic recoil detection analysis were used in analysing these samples. DA - 2006 DB - OpenUCT DP - University of Cape Town LK - https://open.uct.ac.za PB - University of Cape Town PY - 2006 T1 - Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques TI - Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques UR - http://hdl.handle.net/11427/6522 ER - en_ZA
dc.identifier.urihttp://hdl.handle.net/11427/6522
dc.identifier.vancouvercitationAdegbite O. Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques. [Thesis]. University of Cape Town ,Faculty of Science ,Department of Physics, 2006 [cited yyyy month dd]. Available from: http://hdl.handle.net/11427/6522en_ZA
dc.language.isoengen_ZA
dc.publisher.departmentDepartment of Physicsen_ZA
dc.publisher.facultyFaculty of Scienceen_ZA
dc.publisher.institutionUniversity of Cape Town
dc.subject.otherPhysicsen_ZA
dc.titleLight element analysis in amorphous and nanocrystalline silicon using ERDA and related techniquesen_ZA
dc.typeMaster Thesis
dc.type.qualificationlevelMasters
dc.type.qualificationnameM Scen_ZA
uct.type.filetypeText
uct.type.filetypeImage
uct.type.publicationResearchen_ZA
uct.type.resourceThesisen_ZA
Files
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
thesis_sci_2006_adegbite_o.pdf
Size:
5.21 MB
Format:
Adobe Portable Document Format
Description:
Download
Collections
Masters