This paper describes an attempt to reconstruct a 3-D object from a set of 35 images captured using a scanning electron microscope. Point matching over overlapping triples of views is used to obtain an initial reconstruction, which is refined using bundle adjustment with the added knowledge that the sequence is closed. Intrinsic camera parameters are estimated via autocalibration under an affine assumption. Good results for the final metric reconstruction are obtained
Reference:
Proceedings of the Fifteenth Annual Symposium of the Pattern Recognition Association of South Africa. 2004. University of Cape Town ,Faculty of Engineering & the Built Environment ,Department of Electrical Engineering. http://hdl.handle.net/11427/24056 .
Proceedings of the Fifteenth Annual Symposium of the Pattern Recognition Association of South Africa. (2004) In F. Nicolls. (Ed.), University of Cape Town ,Faculty of Engineering & the Built Environment ,Department of Electrical Engineering. http://hdl.handle.net/11427/24056
Proceedings of the Fifteenth Annual Symposium of the Pattern Recognition Association of South Africa. (2004) In F. Nicolls. (Ed.), University of Cape Town ,Faculty of Engineering & the Built Environment ,Department of Electrical Engineering. http://hdl.handle.net/11427/24056"Proceedings of the Fifteenth Annual Symposium of the Pattern Recognition Association of South Africa." (2004): http://hdl.handle.net/11427/24056
Proceedings of the Fifteenth Annual Symposium of the Pattern Recognition Association of South Africa. (2004) In F. Nicolls. (Ed.), University of Cape Town ,Faculty of Engineering & the Built Environment ,Department of Electrical Engineering. http://hdl.handle.net/11427/24056"Proceedings of the Fifteenth Annual Symposium of the Pattern Recognition Association of South Africa." (2004): http://hdl.handle.net/11427/24056Nicolls F, editor. Proceedings of the Fifteenth Annual Symposium of the Pattern Recognition Association of South Africa; University of Cape Town ,Faculty of Engineering & the Built Environment ,Department of Electrical Engineering; 2004. http://hdl.handle.net/11427/24056 .