Residual stress in Pt coatings under thermal influence

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dc.contributor.advisorHärting, Margiten_ZA
dc.contributor.authorNtsoane, T Pen_ZA
dc.date.accessioned2014-10-25T18:59:51Z
dc.date.available2014-10-25T18:59:51Z
dc.date.issued2001en_ZA
dc.descriptionIncludes bibliographical references.en_ZA
dc.description.abstractResistance thermometers are commonly employed when accurate temperature measurements are required. The detection part consists of a thin metallic film deposited on a ceramic substrate. In this work, commercially manufactured Pt-Al₂O₃ composites annealed at 0°C, 300°C, 600°C and 1170°C above room temperature were investigated for residual stress using the non-destructive X-ray diffraction technique. The apparatus used for the investigation was a Ψ-goniometer with a scintillation detector. The measured data were analysed with "sin²Ψ"-method. The total stress yielded was found to be a superposition of both the thermal and intrinsic stress in the layer. Analytical model, following the method of Tsui and Clyne, was used to resolve the two stress contributions. With the thermal component being constant, the variation of the observed total stress was attributed to the relaxing intrinsic components. Further investigations of the samples included the microstructure studies using Scanning Electron Microscopy (SEM).en_ZA
dc.identifier.apacitationNtsoane, T. P. (2001). <i>Residual stress in Pt coatings under thermal influence</i>. (Thesis). University of Cape Town ,Faculty of Science ,Department of Physics. Retrieved from http://hdl.handle.net/11427/8778en_ZA
dc.identifier.chicagocitationNtsoane, T P. <i>"Residual stress in Pt coatings under thermal influence."</i> Thesis., University of Cape Town ,Faculty of Science ,Department of Physics, 2001. http://hdl.handle.net/11427/8778en_ZA
dc.identifier.citationNtsoane, T. 2001. Residual stress in Pt coatings under thermal influence. University of Cape Town.en_ZA
dc.identifier.ris TY - Thesis / Dissertation AU - Ntsoane, T P AB - Resistance thermometers are commonly employed when accurate temperature measurements are required. The detection part consists of a thin metallic film deposited on a ceramic substrate. In this work, commercially manufactured Pt-Al₂O₃ composites annealed at 0°C, 300°C, 600°C and 1170°C above room temperature were investigated for residual stress using the non-destructive X-ray diffraction technique. The apparatus used for the investigation was a Ψ-goniometer with a scintillation detector. The measured data were analysed with "sin²Ψ"-method. The total stress yielded was found to be a superposition of both the thermal and intrinsic stress in the layer. Analytical model, following the method of Tsui and Clyne, was used to resolve the two stress contributions. With the thermal component being constant, the variation of the observed total stress was attributed to the relaxing intrinsic components. Further investigations of the samples included the microstructure studies using Scanning Electron Microscopy (SEM). DA - 2001 DB - OpenUCT DP - University of Cape Town LK - https://open.uct.ac.za PB - University of Cape Town PY - 2001 T1 - Residual stress in Pt coatings under thermal influence TI - Residual stress in Pt coatings under thermal influence UR - http://hdl.handle.net/11427/8778 ER - en_ZA
dc.identifier.urihttp://hdl.handle.net/11427/8778
dc.identifier.vancouvercitationNtsoane TP. Residual stress in Pt coatings under thermal influence. [Thesis]. University of Cape Town ,Faculty of Science ,Department of Physics, 2001 [cited yyyy month dd]. Available from: http://hdl.handle.net/11427/8778en_ZA
dc.language.isoengen_ZA
dc.publisher.departmentDepartment of Physicsen_ZA
dc.publisher.facultyFaculty of Scienceen_ZA
dc.publisher.institutionUniversity of Cape Town
dc.subject.otherPhysicsen_ZA
dc.titleResidual stress in Pt coatings under thermal influenceen_ZA
dc.typeMaster Thesis
dc.type.qualificationlevelMasters
dc.type.qualificationnameMScen_ZA
uct.type.filetypeText
uct.type.filetypeImage
uct.type.publicationResearchen_ZA
uct.type.resourceThesisen_ZA
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